説明
KLA Candela 8720 Surface Defect Inspection System, 2" Optical System Unit Laser Light Source: - 405 nm Laser Diode - 660 nmLaser Diode Detection Channel: - Scatter (Oblique, Normal) - Specular -Topography - Phase - PL (Option) Transfer Unit - Single Wafer Loading: Automatic Transfer by Wafer Transfer Robot - Optical Notch Detection / Flat Detection Mode - Wafer Thickness Detection: Laser Transmission Thickness Detection Module (DTD), Laser Diode 660 nm Computer Unit - CPU: XEON E5-2620 2.0 GHz, 20 MB cache - HDD: 3TB - Network Card: Ether Network Card - Monitor: 19 inch LCD Monitor - Pointing Device: Optical Trackball Software: - Operating System: Microsoft Windows Server 2008 Operating system (English Version) - Candela 8720 Application Software: Version 10 Custom Specifications: - A transformer for stepping up the power supply voltage from 200 V to 230 V - Aligner is broken構成
構成なしOEMモデルの説明
The Candela 8720 wafer inspection system uses proprietary optical technology to detect and classify a broad range of defects on high-end compound semiconductor materials up to 200mm in diameter. It is suitable for macro and micro defects and has various use cases in quality control, process control, and vendor comparison. It is used in industries such as HBLED, MicroLED, GaN RF and power applications, and communications. Options include SECS-GEM, light tower, diamond scribe, calibration standards, offline software, OCR, and photoluminescence.ドキュメント
ドキュメントなし
検証済み
カテゴリ
Defect Inspection
最終検証： 5日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
150744
ウェーハサイズ：
2"/50mm
ヴィンテージ：
2018
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
KLA
CANDELA 8720
カテゴリ
Defect Inspection
最終検証： 5日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
150744
ウェーハサイズ：
2"/50mm
ヴィンテージ：
2018
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
KLA Candela 8720 Surface Defect Inspection System, 2" Optical System Unit Laser Light Source: - 405 nm Laser Diode - 660 nmLaser Diode Detection Channel: - Scatter (Oblique, Normal) - Specular -Topography - Phase - PL (Option) Transfer Unit - Single Wafer Loading: Automatic Transfer by Wafer Transfer Robot - Optical Notch Detection / Flat Detection Mode - Wafer Thickness Detection: Laser Transmission Thickness Detection Module (DTD), Laser Diode 660 nm Computer Unit - CPU: XEON E5-2620 2.0 GHz, 20 MB cache - HDD: 3TB - Network Card: Ether Network Card - Monitor: 19 inch LCD Monitor - Pointing Device: Optical Trackball Software: - Operating System: Microsoft Windows Server 2008 Operating system (English Version) - Candela 8720 Application Software: Version 10 Custom Specifications: - A transformer for stepping up the power supply voltage from 200 V to 230 V - Aligner is broken構成
構成なしOEMモデルの説明
The Candela 8720 wafer inspection system uses proprietary optical technology to detect and classify a broad range of defects on high-end compound semiconductor materials up to 200mm in diameter. It is suitable for macro and micro defects and has various use cases in quality control, process control, and vendor comparison. It is used in industries such as HBLED, MicroLED, GaN RF and power applications, and communications. Options include SECS-GEM, light tower, diamond scribe, calibration standards, offline software, OCR, and photoluminescence.ドキュメント
ドキュメントなし