説明
Wafer inspection system構成
Power requirements: 208 V 50/60 Hz CE markedOEMモデルの説明
In October 2009, KLA launched the 8900 defect inspection system, a new tool for the CMOS Image Sensor market. The 8900 is designed to enable capture of a wide variety of defect types, with adjustable sensitivity and throughput settings for cost-effective defect management from initial product development through volume production of color filter arrays.ドキュメント
ドキュメントなし
KLA
8900
カテゴリ
Defect Inspection
最終検証： 10日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
153416
ウェーハサイズ：
8"/200mm, 12"/300mm
ヴィンテージ：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Wafer inspection system構成
Power requirements: 208 V 50/60 Hz CE markedOEMモデルの説明
In October 2009, KLA launched the 8900 defect inspection system, a new tool for the CMOS Image Sensor market. The 8900 is designed to enable capture of a wide variety of defect types, with adjustable sensitivity and throughput settings for cost-effective defect management from initial product development through volume production of color filter arrays.ドキュメント
ドキュメントなし