説明
説明なし構成
構成なしOEMモデルの説明
The Optistation 7 IC Wafer Inspection System Dual, a 300mm fabrication compliant unit featuring a feeder arm transfer unit offering high throughput with a new macro illumination system allowing for thin film observation and defocus detection as well as detection of particulates and scratches on both front and backside.ドキュメント
ドキュメントなし
NIKON
OPTISTATION 7
検証済み
カテゴリ
Defect Inspection
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
14501
ウェーハサイズ:
不明
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
NIKON
OPTISTATION 7
カテゴリ
Defect Inspection
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
14501
ウェーハサイズ:
不明
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
構成なしOEMモデルの説明
The Optistation 7 IC Wafer Inspection System Dual, a 300mm fabrication compliant unit featuring a feeder arm transfer unit offering high throughput with a new macro illumination system allowing for thin film observation and defocus detection as well as detection of particulates and scratches on both front and backside.ドキュメント
ドキュメントなし