説明
PROPERTY Version-2.0 SYSTEM INFORMATION Product Type-T5833 Power Frequency-60 PStype- THtype-QSTH MBtype-NORMAL SYS-Ctype-STANDARD RCPUcount-0 FMfunction- STANDARD FmECC-DISABLE FmHSFbmap- DISABLE構成
構成なしOEMモデルの説明
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.ドキュメント
ドキュメントなし
ADVANTEST
T5833
検証済み
カテゴリ
Final Test
最終検証: 21日前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
102948
ウェーハサイズ:
不明
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示ADVANTEST
T5833
カテゴリ
Final Test
最終検証: 21日前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
102948
ウェーハサイズ:
不明
ヴィンテージ:
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
PROPERTY Version-2.0 SYSTEM INFORMATION Product Type-T5833 Power Frequency-60 PStype- THtype-QSTH MBtype-NORMAL SYS-Ctype-STANDARD RCPUcount-0 FMfunction- STANDARD FmECC-DISABLE FmHSFbmap- DISABLE構成
構成なしOEMモデルの説明
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.ドキュメント
ドキュメントなし