説明
Epi Metrology & Testers構成
Software Version: Carmel Version 2015.3.8300 / Lynx Version 2.15.3.8300 Lasers: 355nm and 405nm Process: Photoluminescence on InGaN or AlInGaP LED wafers Spare Parts: Potentially some available PL SystemOEMモデルの説明
Imperia is a photoluminescence (“PL”) full wafer imaging and mapping system designed for high-volume compound semiconductor metrology applications including power control and photonics applications adding significant inspection and substrate metrology capability to the established PL fleet.ドキュメント
ドキュメントなし
カテゴリ
Metrology
最終検証： 17日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
134527
ウェーハサイズ：
6"/150mm
ヴィンテージ：
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
IMPERIA
カテゴリ
Metrology
最終検証： 17日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
134527
ウェーハサイズ：
6"/150mm
ヴィンテージ：
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Epi Metrology & Testers構成
Software Version: Carmel Version 2015.3.8300 / Lynx Version 2.15.3.8300 Lasers: 355nm and 405nm Process: Photoluminescence on InGaN or AlInGaP LED wafers Spare Parts: Potentially some available PL SystemOEMモデルの説明
Imperia is a photoluminescence (“PL”) full wafer imaging and mapping system designed for high-volume compound semiconductor metrology applications including power control and photonics applications adding significant inspection and substrate metrology capability to the established PL fleet.ドキュメント
ドキュメントなし