説明
-Uses a cantilever with a sharp tip to scan sample surfaces, achieving sub nanometer resolution. -Capable of contact mode, tapping mode, nanoindentation, and force modulation imaging. -Accommodates sample sizes up to 200 mm, making it suitable for semiconductor wafers and large materials. -Used for measuring surface roughness, magnetic structures, and conducting electric measurements. Dimensions: 35.5" Width 53" Height 37" Depth構成
構成なしOEMモデルの説明
The Dimension 3100 Scanning Probe Microscope (SPM) is a high-resolution imaging device that produces three-dimensional images of a sample surface. The microscope works by scanning a sharp tip, mounted on a flexible cantilever, over the sample surface. The cantilever is attached to one end of a cylindrical piezoelectric tube, which is mounted near the top of the microscope. By applying voltages to the X, Y, and Z electrodes on the piezoelectric tube, the tube can be deflected horizontally and vertically to produce a precise raster scan over the sample surface. A stepper motor translates a slide with the sample attached, while a separate motor drive controls the height of the microscope and tip relative to the sample surface. This allows for accurate and detailed imaging of the sample surface.ドキュメント
ドキュメントなし
カテゴリ
Microscope
最終検証： 7日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
142992
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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VEECO / DIGITAL INSTRUMENTS
DIMENSION 3100
カテゴリ
Microscope
最終検証： 7日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
142992
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
-Uses a cantilever with a sharp tip to scan sample surfaces, achieving sub nanometer resolution. -Capable of contact mode, tapping mode, nanoindentation, and force modulation imaging. -Accommodates sample sizes up to 200 mm, making it suitable for semiconductor wafers and large materials. -Used for measuring surface roughness, magnetic structures, and conducting electric measurements. Dimensions: 35.5" Width 53" Height 37" Depth構成
構成なしOEMモデルの説明
The Dimension 3100 Scanning Probe Microscope (SPM) is a high-resolution imaging device that produces three-dimensional images of a sample surface. The microscope works by scanning a sharp tip, mounted on a flexible cantilever, over the sample surface. The cantilever is attached to one end of a cylindrical piezoelectric tube, which is mounted near the top of the microscope. By applying voltages to the X, Y, and Z electrodes on the piezoelectric tube, the tube can be deflected horizontally and vertically to produce a precise raster scan over the sample surface. A stepper motor translates a slide with the sample attached, while a separate motor drive controls the height of the microscope and tip relative to the sample surface. This allows for accurate and detailed imaging of the sample surface.ドキュメント
ドキュメントなし