説明
Semiautomatic Probing Station w/Temptronic Chuck構成
Manufacturer: Cascade Microtech Model: 12651 Summit 12000-series semi-automatic probing station With MicroChamber for temperature-dependent characterization of devices Light- and EMI/RFI-tight testing enclosure Temptronic Thermochuck for -65º to +200ºC chuck temperature control (partial, see notes) Chamber top-hat ensures frost-free, condensation-free cold probing (requires inert gas) Motorized XYZ wafer stage also has manual adjustable XY and theta motion Thermochuck 8" vacuum chuck Joystick or software stage motion controls Easy-access roll out stage Locking e-stop button with 2 keys FormFactor Nucleus and Cascade Microtech WinCal XE software on Windows PC Optem A-Zoom 389220C2 New Technologies microscope with video and eyepiece viewing Super long working distance Mitutoyo objective lenses A-Zoom Laplink Variable intensity illuminator Manual microscope zoom Mitutoyo M Plan Apo 10x objective lens 378-802-2 Mitutoyo M Plan Apo 5x objective lens 378-803-2 Eyepieces: SUW10x Coarse and fine manual focus, plus motorized fine focus Coarse manual scope head XY translation Optem 38-31-40-000 ECL-15P illuminator Temptronic TPO3010B-2100-1 chuck temperature controller Optem 38-51-00-00 illuminator control Very high mass system to reduce vibration Kinetic Vibraplane 48" x 36" air-isolated vibration reduction table further reduces vibration Micromanipulators NOT included Large low-temperature chiller module NOT includedOEMモデルの説明
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterizationドキュメント
ドキュメントなし
FORM FACTOR / CASCADE MICROTECH / FRT
SUMMIT 12000
検証済み
カテゴリ
Probers
最終検証： 17日前
主なアイテムの詳細
状態：
Parts Tool
稼働ステータス:
不明
製品ID：
115819
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
FORM FACTOR / CASCADE MICROTECH / FRT
SUMMIT 12000
カテゴリ
Probers
最終検証： 17日前
主なアイテムの詳細
状態：
Parts Tool
稼働ステータス:
不明
製品ID：
115819
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Semiautomatic Probing Station w/Temptronic Chuck構成
Manufacturer: Cascade Microtech Model: 12651 Summit 12000-series semi-automatic probing station With MicroChamber for temperature-dependent characterization of devices Light- and EMI/RFI-tight testing enclosure Temptronic Thermochuck for -65º to +200ºC chuck temperature control (partial, see notes) Chamber top-hat ensures frost-free, condensation-free cold probing (requires inert gas) Motorized XYZ wafer stage also has manual adjustable XY and theta motion Thermochuck 8" vacuum chuck Joystick or software stage motion controls Easy-access roll out stage Locking e-stop button with 2 keys FormFactor Nucleus and Cascade Microtech WinCal XE software on Windows PC Optem A-Zoom 389220C2 New Technologies microscope with video and eyepiece viewing Super long working distance Mitutoyo objective lenses A-Zoom Laplink Variable intensity illuminator Manual microscope zoom Mitutoyo M Plan Apo 10x objective lens 378-802-2 Mitutoyo M Plan Apo 5x objective lens 378-803-2 Eyepieces: SUW10x Coarse and fine manual focus, plus motorized fine focus Coarse manual scope head XY translation Optem 38-31-40-000 ECL-15P illuminator Temptronic TPO3010B-2100-1 chuck temperature controller Optem 38-51-00-00 illuminator control Very high mass system to reduce vibration Kinetic Vibraplane 48" x 36" air-isolated vibration reduction table further reduces vibration Micromanipulators NOT included Large low-temperature chiller module NOT includedOEMモデルの説明
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterizationドキュメント
ドキュメントなし