説明
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements. EQUIPMENT CONFIGURATION & SPECIFICATIONS Probe Station: Cascade Summit 12000-series semi-automatic wafer probe station with MicroChamber(TM) Wafer Chuck: 8-inch/200mm RF/Microwave wafer chuck (Ni) System Controller: 19-inch rack-mount computer; Windows XP Professional(TM) operating system and Nucleus(TM) 2.7 prober control software. Microscope: Mitutotyo FS50 compound microscope: includes 10X eyepieces and MPlan APO 20X objective len. Additional microscope lenses are sold separately. Large Area Bridge Mount: 6-inch X axis travel (+/- 3-inch from center of travel); 8-inch Y axis travel (+/- 4-inch from center of travel); 3-inch linear manual Z-lift構成
Windows10 with Nucleus 3.3.4 prober control software with vib-iso workstation with Probe Card HolderOEMモデルの説明
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterizationドキュメント
ドキュメントなし
FORM FACTOR / CASCADE MICROTECH / FRT
SUMMIT 12000
検証済み
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
103892
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
FORM FACTOR / CASCADE MICROTECH / FRT
SUMMIT 12000
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
103892
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements. EQUIPMENT CONFIGURATION & SPECIFICATIONS Probe Station: Cascade Summit 12000-series semi-automatic wafer probe station with MicroChamber(TM) Wafer Chuck: 8-inch/200mm RF/Microwave wafer chuck (Ni) System Controller: 19-inch rack-mount computer; Windows XP Professional(TM) operating system and Nucleus(TM) 2.7 prober control software. Microscope: Mitutotyo FS50 compound microscope: includes 10X eyepieces and MPlan APO 20X objective len. Additional microscope lenses are sold separately. Large Area Bridge Mount: 6-inch X axis travel (+/- 3-inch from center of travel); 8-inch Y axis travel (+/- 4-inch from center of travel); 3-inch linear manual Z-lift構成
Windows10 with Nucleus 3.3.4 prober control software with vib-iso workstation with Probe Card HolderOEMモデルの説明
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterizationドキュメント
ドキュメントなし