説明
説明なし構成
構成なしOEMモデルの説明
300 mm Semi-/Fully-automated Probe System. The CM300 offers measurement accuracy and reliability in a solution that is completely modular – whether it’s I-V/C-V, RTN and RF measurements in one semi-automated system, or a fully-automated dual-prober system that handles any combination of 200 mm and 300 mm wafers. With renowned Cascade Microtech precision measurement expertise, you can confidently deliver accurate and reliable data for current and evolving device technologies. By that the CM300 provides faster lifetime predictability in the reliability process, and less design iterations in the modeling process. Productivity and efficiency are increased with the ability to test over a wide temperature range, and to maintain probe-to-pad accuracy for testing on small pads down to 40 µm.ドキュメント
ドキュメントなし
FORM FACTOR / CASCADE MICROTECH / FRT
CM300
検証済み
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
97596
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
FORM FACTOR / CASCADE MICROTECH / FRT
CM300
カテゴリ
Probers
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
97596
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
構成なしOEMモデルの説明
300 mm Semi-/Fully-automated Probe System. The CM300 offers measurement accuracy and reliability in a solution that is completely modular – whether it’s I-V/C-V, RTN and RF measurements in one semi-automated system, or a fully-automated dual-prober system that handles any combination of 200 mm and 300 mm wafers. With renowned Cascade Microtech precision measurement expertise, you can confidently deliver accurate and reliable data for current and evolving device technologies. By that the CM300 provides faster lifetime predictability in the reliability process, and less design iterations in the modeling process. Productivity and efficiency are increased with the ability to test over a wide temperature range, and to maintain probe-to-pad accuracy for testing on small pads down to 40 µm.ドキュメント
ドキュメントなし