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KLA P-1
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The Tencor P-1 Long Scan stylus profiler is the first in the industry to offer ultra-flat 200mm scans in a single profile, without the need to stitch. The release of the P-1 Long Scan profiler features a revolutionary new design, with industry-first innovations to the scanning stage, optics, and sensor technology-—innovations that provide rock-solid stability, unbeatable sensitivity and repeatability. The system features an ultra-flat scanning stage capable of high-resolution scans up to 200mm in a single scan, enabling characterization of surface roughness, waviness, and thin-film stress. The new stage is also the industry’s first 3D scanning stage, adding a third dimension to characterize surface topography. The system features the first top-view optics to provide a clear view of the sample, free of distortion from the traditional angled side-view. Finally, the sensor technology incorporates the industry’s first and only linear variable differential capacitor (LVDC), resulting in sub-Angstrom electronic resolution with a low moment of inertia, enabling low force control and reducing sensitivity to noise.
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    ドキュメントなし

    KLA

    P-1

    verified-listing-icon

    検証済み

    カテゴリ

    Profiler
    最終検証: 60日以上前
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    36128


    ウェーハサイズ:

    不明


    ヴィンテージ:

    1990

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA P-1
    KLAP-1Profiler
    ヴィンテージ: 0状態: 中古
    最終確認60日以上前

    KLA

    P-1

    verified-listing-icon

    検証済み

    カテゴリ

    Profiler
    最終検証: 60日以上前
    listing-photo-4460330f06b94309801c68358392c5dc-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1689/36128/8f9fd4e713574ff7af4775c92c03a816_55302a43eb8948368609424229915492image281_mw.jpeg
    listing-photo-4460330f06b94309801c68358392c5dc-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1689/36128/286bac4c2a884293a69699f35aaf21ec_bd134babfb0748dcbc922de02665f917image281_mw.jpeg
    listing-photo-4460330f06b94309801c68358392c5dc-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1689/36128/98fd4318575e4bc3a0dbb7819c8c14e9_629488d19ea346d78f2471f80a50aa21image282_mw.jpeg
    listing-photo-4460330f06b94309801c68358392c5dc-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1689/36128/5a200a04fb414ca8b32fdd9368a9cd9a_1b7a632e9f0f432f85a9b257509a5aa0image282_mw.jpeg
    listing-photo-4460330f06b94309801c68358392c5dc-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1689/36128/22f4aff5bf3d46cdb448719b8bb7a7ac_35150b51732e4571a0ca6acc113e9d99image283_mw.jpeg
    listing-photo-4460330f06b94309801c68358392c5dc-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1689/36128/da1c92f65fa943cebdd211a1910cb279_fd70570bc9c94f0da7be8c9548274ebdimage283_mw.jpeg
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    36128


    ウェーハサイズ:

    不明


    ヴィンテージ:

    1990


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The Tencor P-1 Long Scan stylus profiler is the first in the industry to offer ultra-flat 200mm scans in a single profile, without the need to stitch. The release of the P-1 Long Scan profiler features a revolutionary new design, with industry-first innovations to the scanning stage, optics, and sensor technology-—innovations that provide rock-solid stability, unbeatable sensitivity and repeatability. The system features an ultra-flat scanning stage capable of high-resolution scans up to 200mm in a single scan, enabling characterization of surface roughness, waviness, and thin-film stress. The new stage is also the industry’s first 3D scanning stage, adding a third dimension to characterize surface topography. The system features the first top-view optics to provide a clear view of the sample, free of distortion from the traditional angled side-view. Finally, the sensor technology incorporates the industry’s first and only linear variable differential capacitor (LVDC), resulting in sub-Angstrom electronic resolution with a low moment of inertia, enabling low force control and reducing sensitivity to noise.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA P-1
    KLA
    P-1
    Profilerヴィンテージ: 0状態: 中古最終検証: 60日以上前
    KLA P-1
    KLA
    P-1
    Profilerヴィンテージ: 1990状態: 中古最終検証: 60日以上前