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KLA P-16+
    説明
    Stylus surface profiler
    構成
    構成なし
    OEMモデルの説明
    The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R&D; departments and universities to production and process monitoring. This surface analysis solution's precise force control provides excellent vertical resolution, precision, and reliability measurements. This surface analysis solution delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.
    ドキュメント

    ドキュメントなし

    KLA

    P-16+

    verified-listing-icon

    検証済み

    カテゴリ
    Profiler

    最終検証: 2日前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    115115


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    2012


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA P-16+

    KLA

    P-16+

    Profiler
    ヴィンテージ: 0状態: 中古
    最終確認30日以上前

    KLA

    P-16+

    verified-listing-icon
    検証済み
    カテゴリ
    Profiler
    最終検証: 2日前
    listing-photo-13c2b03b9267436dafa34bf482f1ec45-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/13c2b03b9267436dafa34bf482f1ec45/610d0da7f7044cdba74b73710c60b4e2_1_mw.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    115115


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    2012


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Stylus surface profiler
    構成
    構成なし
    OEMモデルの説明
    The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R&D; departments and universities to production and process monitoring. This surface analysis solution's precise force control provides excellent vertical resolution, precision, and reliability measurements. This surface analysis solution delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA P-16+

    KLA

    P-16+

    Profilerヴィンテージ: 0状態: 中古最終検証:30日以上前
    KLA P-16+

    KLA

    P-16+

    Profilerヴィンテージ: 0状態: 中古最終検証:30日以上前
    KLA P-16+

    KLA

    P-16+

    Profilerヴィンテージ: 2012状態: 中古最終検証:2日前