説明
Surface Profiler構成
構成なしOEMモデルの説明
The Veeco DEKTAK 3030 is a surface profile measuring system designed for measuring the surface profiles of surfaces such as wafers and microelectronic devices. It is capable of measuring surface profiles with a resolution of 0.1 nanometers and a vertical accuracy of 0.25 nanometers. It is also capable of measuring high aspect ratios and precision features. The system uses a stylus-based probe to measure the surface profile, with a stylus force of 0.5 to 5.0 milliNewtons. The system can also be used for measuring surface flatness, surface roughness, and other surface parameters.ドキュメント
ドキュメントなし
検証済み
カテゴリ
Profiler
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
105006
ウェーハサイズ：
不明
ヴィンテージ：
1988
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
VEECO
DEKTAK 3030
カテゴリ
Profiler
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
105006
ウェーハサイズ：
不明
ヴィンテージ：
1988
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Surface Profiler構成
構成なしOEMモデルの説明
The Veeco DEKTAK 3030 is a surface profile measuring system designed for measuring the surface profiles of surfaces such as wafers and microelectronic devices. It is capable of measuring surface profiles with a resolution of 0.1 nanometers and a vertical accuracy of 0.25 nanometers. It is also capable of measuring high aspect ratios and precision features. The system uses a stylus-based probe to measure the surface profile, with a stylus force of 0.5 to 5.0 milliNewtons. The system can also be used for measuring surface flatness, surface roughness, and other surface parameters.ドキュメント
ドキュメントなし