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VEECO DEKTAK 3030
    説明
    Surface Profiler
    構成
    構成なし
    OEMモデルの説明
    The Veeco DEKTAK 3030 is a surface profile measuring system designed for measuring the surface profiles of surfaces such as wafers and microelectronic devices. It is capable of measuring surface profiles with a resolution of 0.1 nanometers and a vertical accuracy of 0.25 nanometers. It is also capable of measuring high aspect ratios and precision features. The system uses a stylus-based probe to measure the surface profile, with a stylus force of 0.5 to 5.0 milliNewtons. The system can also be used for measuring surface flatness, surface roughness, and other surface parameters.
    ドキュメント

    ドキュメントなし

    VEECO

    DEKTAK 3030

    verified-listing-icon

    検証済み

    カテゴリ
    Profiler

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    105007


    ウェーハサイズ:

    不明


    ヴィンテージ:

    1988


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    VEECO DEKTAK 3030

    VEECO

    DEKTAK 3030

    Profiler
    ヴィンテージ: 0状態: 部品ツール
    最終確認16日前

    VEECO

    DEKTAK 3030

    verified-listing-icon
    検証済み
    カテゴリ
    Profiler
    最終検証: 60日以上前
    listing-photo-e7b92bccf0914bf58bf1aea9dd897514-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    105007


    ウェーハサイズ:

    不明


    ヴィンテージ:

    1988


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Surface Profiler
    構成
    構成なし
    OEMモデルの説明
    The Veeco DEKTAK 3030 is a surface profile measuring system designed for measuring the surface profiles of surfaces such as wafers and microelectronic devices. It is capable of measuring surface profiles with a resolution of 0.1 nanometers and a vertical accuracy of 0.25 nanometers. It is also capable of measuring high aspect ratios and precision features. The system uses a stylus-based probe to measure the surface profile, with a stylus force of 0.5 to 5.0 milliNewtons. The system can also be used for measuring surface flatness, surface roughness, and other surface parameters.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    VEECO DEKTAK 3030

    VEECO

    DEKTAK 3030

    Profilerヴィンテージ: 0状態: 部品ツール最終検証:16日前
    VEECO DEKTAK 3030

    VEECO

    DEKTAK 3030

    Profilerヴィンテージ: 1988状態: 中古最終検証:60日以上前
    VEECO DEKTAK 3030

    VEECO

    DEKTAK 3030

    Profilerヴィンテージ: 1988状態: 中古最終検証:60日以上前