説明
R&D and FA Lab構成
SEMOEMモデルの説明
The Nova NanoSEM 600 is a type of high-resolution scanning electron microscope (SEM) that comes equipped with SED, BSED, and STEM detectors. It is a Dual Beam SEM/FIB system that combines the capabilities of ultra-high resolution field emission Scanning Electron Microscopy (SEM) with the precision of Focused Ion Beam (FIB) etching and deposition, making it ideal for nanoscale prototyping, machining, characterization, and analysis. When operating in STEM mode, this microscope can achieve a resolution as low as 1 nanometer. Additionally, the Nova NanoSEM 600 is capable of operating under low vacuum conditions and offers a range of analytical options including EBSD and EDS.ドキュメント
ドキュメントなし
カテゴリ
SEM / FIB
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
134552
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
NOVA NANOSEM 600
カテゴリ
SEM / FIB
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
134552
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
R&D and FA Lab構成
SEMOEMモデルの説明
The Nova NanoSEM 600 is a type of high-resolution scanning electron microscope (SEM) that comes equipped with SED, BSED, and STEM detectors. It is a Dual Beam SEM/FIB system that combines the capabilities of ultra-high resolution field emission Scanning Electron Microscopy (SEM) with the precision of Focused Ion Beam (FIB) etching and deposition, making it ideal for nanoscale prototyping, machining, characterization, and analysis. When operating in STEM mode, this microscope can achieve a resolution as low as 1 nanometer. Additionally, the Nova NanoSEM 600 is capable of operating under low vacuum conditions and offers a range of analytical options including EBSD and EDS.ドキュメント
ドキュメントなし