説明
a 200kV field emission transmission electron microscope that combines high-resolution imaging with powerful chemical composition analysis capabilities. Its compact structure and excellent stability make it a primary instrument for routine microscopic characterization and analysis of nanomaterials. Main Unit (The Core Instrument): FEI Tecnai F20 1 • Transmission Electron Microscope Main Unit: FEI Tecnai F20 • Schottky Field Emission Gun (FEG) • Host Workstation + LCD Monitor • Electron Gun & Column (System Column) • Control Operating Panels ($2\times$) • $200\text{ kV}$ High-Voltage Tank / Box • Power Control Cabinet 1 Bottom-Mount Digital Camera 2 • Gatan OneView Camera (with in-situ capabilities) • Controller and Imaging Software 1 Align Genie (Beam Alignment) 3 Microscope Alignment Files (One free-of-charge alignment at $200\text{ kV}$) 1 Energy-Dispersive X-ray Spectrometer (EDS) 4 Oxford Xplore 80 Detector ($80\text{ mm}^2$) 1 5 X4 Processor (Graphics & Pulse Processor) 1 Scanning Transmission Mode (STEM) 6 Fischione HAADF Detector and STEM Control Cabinet 1 7 TIA Imaging Software 1 Cooler / Compressor 8 Air Compressor 1 9 Water Chiller / Tank 1 Vacuum System 10 Mechanical Pump, Turbo Molecular Pump, Ion Getter Pump 1 Software and Control Systems 11 Operating System: Windows-based OS 1 12 Control Software: FEI TUI Software Platform (controls all microscope functions, lenses, alignments, cameras, and attachments)構成
Accelerating Voltage: 200 kV Electron Gun: Thermal Field Emission Source (Schottky FEG) Energy Resolution: < 0.7 eV Point Resolution: 0.24 nm Information Limit: 0.14 nm Line Resolution: 0.102 nm Magnification Range: 25x – 1,030,000xOEMモデルの説明
提供なしドキュメント
ドキュメントなし
カテゴリ
TEM
最終検証： 18日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
151896
ウェーハサイズ：
不明
ヴィンテージ：
2005
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
Tecnai T20
カテゴリ
TEM
最終検証： 18日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
151896
ウェーハサイズ：
不明
ヴィンテージ：
2005
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
a 200kV field emission transmission electron microscope that combines high-resolution imaging with powerful chemical composition analysis capabilities. Its compact structure and excellent stability make it a primary instrument for routine microscopic characterization and analysis of nanomaterials. Main Unit (The Core Instrument): FEI Tecnai F20 1 • Transmission Electron Microscope Main Unit: FEI Tecnai F20 • Schottky Field Emission Gun (FEG) • Host Workstation + LCD Monitor • Electron Gun & Column (System Column) • Control Operating Panels ($2\times$) • $200\text{ kV}$ High-Voltage Tank / Box • Power Control Cabinet 1 Bottom-Mount Digital Camera 2 • Gatan OneView Camera (with in-situ capabilities) • Controller and Imaging Software 1 Align Genie (Beam Alignment) 3 Microscope Alignment Files (One free-of-charge alignment at $200\text{ kV}$) 1 Energy-Dispersive X-ray Spectrometer (EDS) 4 Oxford Xplore 80 Detector ($80\text{ mm}^2$) 1 5 X4 Processor (Graphics & Pulse Processor) 1 Scanning Transmission Mode (STEM) 6 Fischione HAADF Detector and STEM Control Cabinet 1 7 TIA Imaging Software 1 Cooler / Compressor 8 Air Compressor 1 9 Water Chiller / Tank 1 Vacuum System 10 Mechanical Pump, Turbo Molecular Pump, Ion Getter Pump 1 Software and Control Systems 11 Operating System: Windows-based OS 1 12 Control Software: FEI TUI Software Platform (controls all microscope functions, lenses, alignments, cameras, and attachments)構成
Accelerating Voltage: 200 kV Electron Gun: Thermal Field Emission Source (Schottky FEG) Energy Resolution: < 0.7 eV Point Resolution: 0.24 nm Information Limit: 0.14 nm Line Resolution: 0.102 nm Magnification Range: 25x – 1,030,000xOEMモデルの説明
提供なしドキュメント
ドキュメントなし