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説明
説明なし構成
構成なしOEMモデルの説明
In February 2006, KLA introduced the latest addition to our eS3x series of e-beam inspection systems—the eS32. A single system spanning development and production applications, the eS32 provides the best sensitivity at throughput for defect types that optical systems cannot find.ドキュメント
ドキュメントなし
KLA
eS32
カテゴリ
Defect Inspection
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
109536
ウェーハサイズ：
12"/300mm
ヴィンテージ：
不明
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説明
説明なし構成
構成なしOEMモデルの説明
In February 2006, KLA introduced the latest addition to our eS3x series of e-beam inspection systems—the eS32. A single system spanning development and production applications, the eS32 provides the best sensitivity at throughput for defect types that optical systems cannot find.ドキュメント
ドキュメントなし