説明
説明なし構成
KLA ES32 (1) - Stage, electron source, feed throughs included KLA ES32 (2) - Stage, electron source, pre-aligner, feed throughs, stage lasers included Scan amp boards are missing on both toolsOEMモデルの説明
In February 2006, KLA introduced the latest addition to our eS3x series of e-beam inspection systems—the eS32. A single system spanning development and production applications, the eS32 provides the best sensitivity at throughput for defect types that optical systems cannot find.ドキュメント
ドキュメントなし
KLA
eS32
検証済み
カテゴリ
Defect Inspection
主なアイテムの詳細
状態：
Parts Tool
稼働ステータス:
不明
製品ID：
44484
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
KLA
eS32
検証済み
カテゴリ
Defect Inspection
最終検証： 60日以上前
主なアイテムの詳細
状態：
Parts Tool
稼働ステータス:
不明
製品ID：
44484
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
KLA ES32 (1) - Stage, electron source, feed throughs included KLA ES32 (2) - Stage, electron source, pre-aligner, feed throughs, stage lasers included Scan amp boards are missing on both toolsOEMモデルの説明
In February 2006, KLA introduced the latest addition to our eS3x series of e-beam inspection systems—the eS32. A single system spanning development and production applications, the eS32 provides the best sensitivity at throughput for defect types that optical systems cannot find.ドキュメント
ドキュメントなし