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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA eV300
    説明
    Has known bad board, for parts, may also be missing a skin or two
    構成
    構成なし
    OEMモデルの説明
    The eV300 defect review system, an advanced, automated SEM designed to gather defect excursion information, analyze and report the results with the improved sensitivity required at smaller design rules. The eV300 supplements optical review by providing topographical information, enabling more accurate defect classification than can be achieved by optical review systems alone.
    ドキュメント

    ドキュメントなし

    KLA

    eV300

    verified-listing-icon

    検証済み

    カテゴリ
    Defect Inspection

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    87146


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA eV300

    KLA

    eV300

    Defect Inspection
    ヴィンテージ: 0状態: 中古
    最終確認60日以上前

    KLA

    eV300

    verified-listing-icon
    検証済み
    カテゴリ
    Defect Inspection
    最終検証: 60日以上前
    listing-photo-57ce3bf4464c4930adf1d77720ce862b-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    87146


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Has known bad board, for parts, may also be missing a skin or two
    構成
    構成なし
    OEMモデルの説明
    The eV300 defect review system, an advanced, automated SEM designed to gather defect excursion information, analyze and report the results with the improved sensitivity required at smaller design rules. The eV300 supplements optical review by providing topographical information, enabling more accurate defect classification than can be achieved by optical review systems alone.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA eV300

    KLA

    eV300

    Defect Inspectionヴィンテージ: 0状態: 中古最終検証:60日以上前
    KLA eV300

    KLA

    eV300

    Defect Inspectionヴィンテージ: 0状態: 部品ツール最終検証:60日以上前
    KLA eV300

    KLA

    eV300

    Defect Inspectionヴィンテージ: 0状態: 中古最終検証:60日以上前