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KLA CANDELA CS20
  • KLA CANDELA CS20
  • KLA CANDELA CS20
  • KLA CANDELA CS20
  • KLA CANDELA CS20
  • KLA CANDELA CS20
  • KLA CANDELA CS20
説明
Optical Defect Inspection
構成
構成なし
OEMモデルの説明
The Candela CS20 system measures surface reflectivity and topography for automatic defect detection and classification. It uses scatterometry, ellipsometry, reflectometry, and topographical analysis to inspect wafer surfaces for defects and film thickness uniformity. It is designed for inspection of transparent materials such as sapphire and GaN and can detect a wide variety of defects. It is suitable for use in the production of High Brightness Light Emitting Diodes (HBLEDs), High-Power RF Devices, and Coated Glass (CMOS imagers, LCoS chips, etc.).
ドキュメント

ドキュメントなし

verified-listing-icon

検証済み

カテゴリ
Defect Inspection

最終検証: 60日以上前

主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

115111


ウェーハサイズ:

6"/150mm


ヴィンテージ:

2006


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KLA

CANDELA CS20

verified-listing-icon
検証済み
カテゴリ
Defect Inspection
最終検証: 60日以上前
listing-photo-8f31fa05dbc04b939778b7bb997f2e9b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/8f31fa05dbc04b939778b7bb997f2e9b/dac080f264704972bf46e2083958d6eb_spk361200000copy_mw.jpg
listing-photo-8f31fa05dbc04b939778b7bb997f2e9b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/8f31fa05dbc04b939778b7bb997f2e9b/e0a2adfeee22454c99bc1faa92f4deb1_spk36100000_mw.jpg
listing-photo-8f31fa05dbc04b939778b7bb997f2e9b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/8f31fa05dbc04b939778b7bb997f2e9b/a42fb751d5dd4bf8bb55c68a8f3c9f16_spk361200000_mw.jpg
listing-photo-8f31fa05dbc04b939778b7bb997f2e9b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/8f31fa05dbc04b939778b7bb997f2e9b/37f88c1bce2d401b8bd63ee9dd742c22_spk36110000copy_mw.jpg
listing-photo-8f31fa05dbc04b939778b7bb997f2e9b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/8f31fa05dbc04b939778b7bb997f2e9b/331ef8955e014569bc185796c41389b8_spk36110000_mw.jpg
listing-photo-8f31fa05dbc04b939778b7bb997f2e9b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/8f31fa05dbc04b939778b7bb997f2e9b/8228240b6031467f8c99873faac89295_spk36140000_mw.jpg
主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

115111


ウェーハサイズ:

6"/150mm


ヴィンテージ:

2006


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Optical Defect Inspection
構成
構成なし
OEMモデルの説明
The Candela CS20 system measures surface reflectivity and topography for automatic defect detection and classification. It uses scatterometry, ellipsometry, reflectometry, and topographical analysis to inspect wafer surfaces for defects and film thickness uniformity. It is designed for inspection of transparent materials such as sapphire and GaN and can detect a wide variety of defects. It is suitable for use in the production of High Brightness Light Emitting Diodes (HBLEDs), High-Power RF Devices, and Coated Glass (CMOS imagers, LCoS chips, etc.).
ドキュメント

ドキュメントなし