Screen Recording 2020-12-21 at 11.12.29 AM 2.mov

KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

The Candela CS20 system measures surface reflectivity and topography for automatic defect detection and classification. It uses scatterometry, ellipsometry, reflectometry, and topographical analysis to inspect wafer surfaces for defects and film thickness uniformity. It is designed for inspection of transparent materials such as sapphire and GaN and can detect a wide variety of defects. It is suitable for use in the production of High Brightness Light Emitting Diodes (HBLEDs), High-Power RF Devices, and Coated Glass (CMOS imagers, LCoS chips, etc.).

CANDELA CS20

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6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

KLA

CANDELA CS20

Defect Inspection

同様のリスト

KLA

CANDELA CS20

KLA

CANDELA CS20

KLA

CANDELA CS20

KLA

CANDELA CS20

KLA

CANDELA CS20

KLA

CANDELA CS20

CANDELA CS20

Defect Inspection

同様のリスト

KLA

CANDELA CS20

KLA

CANDELA CS20

KLA

CANDELA CS20

KLA

CANDELA CS20

KLA

CANDELA CS20

KLA

CANDELA CS20