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KLA CANDELA 8620
  • KLA CANDELA 8620
  • KLA CANDELA 8620
  • KLA CANDELA 8620
説明
説明なし
構成
構成なし
OEMモデルの説明
The Candela 8620 is an automated defect inspection system for LED substrates and epitaxy wafers. It provides enhanced quality control for materials such as gallium nitride, sapphire, and silicon carbide. Its proprietary optical design and detection technology can detect sub-micron defects that are not consistently identified by current inspection methods. This enables a production line monitor for yield-limiting defects, improving MOCVD reactor uptime and yield. The system can detect defects such as micro-scratches, micro-cracks, missing bumps, resist voids, hexagonal pits, and epi cracks, which can impact device performance, yield, and reliability.
ドキュメント

ドキュメントなし

PREFERRED
 
SELLER
verified-listing-icon

検証済み

カテゴリ
Defect Inspection

最終検証: 19日前

Buyer pays 12% premium of final sale price
主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

125595


ウェーハサイズ:

不明


ヴィンテージ:

不明


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
 
SELLER

KLA

CANDELA 8620

verified-listing-icon
検証済み
カテゴリ
Defect Inspection
最終検証: 19日前
listing-photo-3ef11ecf742a465e93b022a518bc8fb4-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
Buyer pays 12% premium of final sale price
主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

125595


ウェーハサイズ:

不明


ヴィンテージ:

不明


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし
構成
構成なし
OEMモデルの説明
The Candela 8620 is an automated defect inspection system for LED substrates and epitaxy wafers. It provides enhanced quality control for materials such as gallium nitride, sapphire, and silicon carbide. Its proprietary optical design and detection technology can detect sub-micron defects that are not consistently identified by current inspection methods. This enables a production line monitor for yield-limiting defects, improving MOCVD reactor uptime and yield. The system can detect defects such as micro-scratches, micro-cracks, missing bumps, resist voids, hexagonal pits, and epi cracks, which can impact device performance, yield, and reliability.
ドキュメント

ドキュメントなし