説明
Wafer Size: 2 ~ 8 inch available (Currently 6" configured) Application S/W: 7.0 Build 11 OS Version: Windows XP professional SP3 Cassette Handling: Standard single puck with up to 200 mm cassette handler capability Illumination Source: Circumferential (50 mW, 405 nm), Radial (85 mW, 660 nm) Performance • Substrate Thickness: 380 ~ 1,300 µm • Defect Sensitivity: 0.08 µm (PSL on bare) Application Defect inspection of both opaque substrates such as Si, GaAs, and InP, as well as transparent materials such as SiC, GaN, sapphire, and glass. Utility • Physical Dimension (WDH): 110 * 138 * 180 cm • Weight Instrument: 860 lb (391 kg) • Input Power: 115 V 12 A 50/60 Hz • CDA: 95 ~ 110 PSI構成
構成なしOEMモデルの説明
The Candela 8620 is an automated defect inspection system for LED substrates and epitaxy wafers. It provides enhanced quality control for materials such as gallium nitride, sapphire, and silicon carbide. Its proprietary optical design and detection technology can detect sub-micron defects that are not consistently identified by current inspection methods. This enables a production line monitor for yield-limiting defects, improving MOCVD reactor uptime and yield. The system can detect defects such as micro-scratches, micro-cracks, missing bumps, resist voids, hexagonal pits, and epi cracks, which can impact device performance, yield, and reliability.ドキュメント
検証済み
カテゴリ
Defect Inspection
最終検証： 今日
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
138243
ウェーハサイズ：
2"/50mm, 3"/75mm, 4"/100mm, 5"/125mm, 6"/150mm
ヴィンテージ：
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
KLA
CANDELA 8620
カテゴリ
Defect Inspection
最終検証： 今日
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
138243
ウェーハサイズ：
2"/50mm, 3"/75mm, 4"/100mm, 5"/125mm, 6"/150mm
ヴィンテージ：
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available