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KLA SP1-TBI
    説明
    With dual SMIF handler. Condition: working condition Current Tool Use: Optical Alignment, plan docking with open cassette handler for test
    構成
    構成なし
    OEMモデルの説明
    The SP1 is an unpatterned surface inspection system that can be configured with KLA-Tencor’s Triple-Beam Illumination™ (TBI) technology for exceptional sensitivity on rough films. This technology adds an oblique illumination beam to the SP1’s standard optical configuration, enhancing its ability to capture and distinguish all variations of pits, including crystal originated pits (COPs), from particles. The TBI option maintains the SP1’s axi-symmetric design and allows the use of Adaptive Collection Optics for superior capture of defects on different substrate surfaces.
    ドキュメント

    ドキュメントなし

    KLA

    SP1-TBI

    verified-listing-icon

    検証済み

    カテゴリ
    Defect Inspection

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Refurbished


    稼働ステータス:

    不明


    製品ID:

    105091


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2006


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA SP1-TBI

    KLA

    SP1-TBI

    Defect Inspection
    ヴィンテージ: 2001状態: 中古
    最終確認20日前

    KLA

    SP1-TBI

    verified-listing-icon
    検証済み
    カテゴリ
    Defect Inspection
    最終検証: 60日以上前
    listing-photo-0340fdda7aae44008ad94fabc2e6bf1a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44197/0340fdda7aae44008ad94fabc2e6bf1a/8a01c9bae1b1439285a906cf8309c821_unnamed_mw.jpg
    listing-photo-0340fdda7aae44008ad94fabc2e6bf1a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44197/0340fdda7aae44008ad94fabc2e6bf1a/824354a043844106baa04c017dc4734d_b8faf0578d06470c92853e0bf8924969_mw.jpeg
    listing-photo-0340fdda7aae44008ad94fabc2e6bf1a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44197/0340fdda7aae44008ad94fabc2e6bf1a/3bd51549c0e84a7a866454ba74d8c522_f44219e4a81e4f9681c0513c2b31bbcd_mw.jpeg
    listing-photo-0340fdda7aae44008ad94fabc2e6bf1a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44197/0340fdda7aae44008ad94fabc2e6bf1a/4e709d2751eb4821ac590583df093ebf_f0f5c4aad4f04504840ce5ddb0fb9e85_mw.jpeg
    listing-photo-0340fdda7aae44008ad94fabc2e6bf1a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44197/0340fdda7aae44008ad94fabc2e6bf1a/4aedd1731c8e43dca4db83558d231e62_4c07fc7759a44c0b9adbcd40b7a17f221201a_mw.jpeg
    主なアイテムの詳細

    状態:

    Refurbished


    稼働ステータス:

    不明


    製品ID:

    105091


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2006


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    With dual SMIF handler. Condition: working condition Current Tool Use: Optical Alignment, plan docking with open cassette handler for test
    構成
    構成なし
    OEMモデルの説明
    The SP1 is an unpatterned surface inspection system that can be configured with KLA-Tencor’s Triple-Beam Illumination™ (TBI) technology for exceptional sensitivity on rough films. This technology adds an oblique illumination beam to the SP1’s standard optical configuration, enhancing its ability to capture and distinguish all variations of pits, including crystal originated pits (COPs), from particles. The TBI option maintains the SP1’s axi-symmetric design and allows the use of Adaptive Collection Optics for superior capture of defects on different substrate surfaces.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA SP1-TBI

    KLA

    SP1-TBI

    Defect Inspectionヴィンテージ: 2001状態: 中古最終検証:20日前
    KLA SP1-TBI

    KLA

    SP1-TBI

    Defect Inspectionヴィンテージ: 0状態: 部品ツール最終検証:30日以上前
    KLA SP1-TBI

    KLA

    SP1-TBI

    Defect Inspectionヴィンテージ: 0状態: 中古最終検証:60日以上前