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KLA SURFSCAN SP2
  • KLA SURFSCAN SP2
  • KLA SURFSCAN SP2
  • KLA SURFSCAN SP2
説明
One 300mm load port and 200mm load port
構成
構成なし
OEMモデルの説明
The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.
ドキュメント

ドキュメントなし

verified-listing-icon

検証済み

カテゴリ
Defect Inspection

最終検証: 18日前

主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

119549


ウェーハサイズ:

8"/200mm, 12"/300mm


ヴィンテージ:

不明


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KLA

SURFSCAN SP2

verified-listing-icon
検証済み
カテゴリ
Defect Inspection
最終検証: 18日前
listing-photo-0c4a3228bab3457caaf8a5c87ef9ca50-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

119549


ウェーハサイズ:

8"/200mm, 12"/300mm


ヴィンテージ:

不明


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
One 300mm load port and 200mm load port
構成
構成なし
OEMモデルの説明
The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.
ドキュメント

ドキュメントなし