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SEMILAB FAAST 230
  • SEMILAB FAAST 230
  • SEMILAB FAAST 230
  • SEMILAB FAAST 230
  • SEMILAB FAAST 230
説明
Rack of Powersupply is defective – Powersupply is ok Function is ok – not in production Tool on cleanroom floor 1 Palette of spares included: 2x Motion Controller (Newport MM3000) 1x DSP Lock-IN Amplifier 1x Robot Controller (Pri ESC-212) 1x Hot Chuck Temperatur Box (SDI) 1x Controller Activation Box (SDI) 1x Robot (Pri ATM-105-1-S) 1x Voltmeter (PDM-40a) 1x Voltmeter (PDM-60V) 1x Function Generator (Wafertek model 29) 1x Aligner (Brooks PRE-200) 2x Power Supply (Bertan 2341-1) 1x Box misc cable
構成
Mainframe
OEMモデルの説明
The SEMILAB FAAST 230 is a non-contact, fast in-line monitoring system designed to detect heavy metal contamination, including sub 108 atoms/cm-3 Fe detection, in a medium to high-volume manufacturing environment. It features automated wafer handling, with options for SMIF/FOUP Loadport/Versaport, and can perform full wafer FAST mapping of diffusion length, Iron, and other recombination centers. The system is configurable for 100 mm to 300 mm wafers and is compatible with other Semilab SDI FAaST tool measurement technologies. Additional options include a minienvironment, wafer edge-grip handling, wafer flipper for automatic backsurface measurement, and more.
ドキュメント

ドキュメントなし

PREFERRED
 
SELLER
verified-listing-icon

検証済み

カテゴリ
Defect Inspection

最終検証: 今日

Buyer pays 12% premium of final sale price
主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

113163


ウェーハサイズ:

不明


ヴィンテージ:

2001


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
 
SELLER

SEMILAB

FAAST 230

verified-listing-icon
検証済み
カテゴリ
Defect Inspection
最終検証: 今日
listing-photo-8805276c587a4e32b240052622982cca-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53724/8805276c587a4e32b240052622982cca/9e7148d28e0e49b086c3c97d9057135a_8cbdf3279f7541629470d68a1d389139_mw.png
listing-photo-8805276c587a4e32b240052622982cca-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53724/8805276c587a4e32b240052622982cca/45c7fa46b2b7429481f3332f881dca38_c5cf96e4ac144095928e0945320fd1de_mw.png
listing-photo-8805276c587a4e32b240052622982cca-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53724/8805276c587a4e32b240052622982cca/ce021c18a6ee4a178ef63424de41184c_68e9977c25b84a9c8edb2ea1452b89bd_mw.png
listing-photo-8805276c587a4e32b240052622982cca-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53724/8805276c587a4e32b240052622982cca/62f6b759e1d34f689ef04cf5eb9ba51f_c2db1761b1cd48fa817da96443ca3172_mw.png
Buyer pays 12% premium of final sale price
主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

113163


ウェーハサイズ:

不明


ヴィンテージ:

2001


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Rack of Powersupply is defective – Powersupply is ok Function is ok – not in production Tool on cleanroom floor 1 Palette of spares included: 2x Motion Controller (Newport MM3000) 1x DSP Lock-IN Amplifier 1x Robot Controller (Pri ESC-212) 1x Hot Chuck Temperatur Box (SDI) 1x Controller Activation Box (SDI) 1x Robot (Pri ATM-105-1-S) 1x Voltmeter (PDM-40a) 1x Voltmeter (PDM-60V) 1x Function Generator (Wafertek model 29) 1x Aligner (Brooks PRE-200) 2x Power Supply (Bertan 2341-1) 1x Box misc cable
構成
Mainframe
OEMモデルの説明
The SEMILAB FAAST 230 is a non-contact, fast in-line monitoring system designed to detect heavy metal contamination, including sub 108 atoms/cm-3 Fe detection, in a medium to high-volume manufacturing environment. It features automated wafer handling, with options for SMIF/FOUP Loadport/Versaport, and can perform full wafer FAST mapping of diffusion length, Iron, and other recombination centers. The system is configurable for 100 mm to 300 mm wafers and is compatible with other Semilab SDI FAaST tool measurement technologies. Additional options include a minienvironment, wafer edge-grip handling, wafer flipper for automatic backsurface measurement, and more.
ドキュメント

ドキュメントなし