説明
KLA-Tencor P-10 Surface Profiler Manufacturer: KLA-Tencor Model: P-10 Equipment Type: Surface Profiler Measurement Method: Contact Stylus Maximum Wafer Size: 8 inch (200 mm) Measurement Capabilities: Step Height, Surface Roughness, Waviness Vertical Measurement Range: Up to approximately 300 µm (configuration dependent) Vertical Resolution: 0.5 / 2 / 10 Å (depending on configuration) Scan Length: 60 mm standard; up to 150 mm on some configurations Scan Speed: 1 µm/s to 25 mm/s Stylus Tip: Diamond, 2 µm radius (configuration dependent) Stage: Motorized XY Stage The KLA-Tencor P-10 is a contact stylus surface profiler designed for measuring step height, surface roughness, and waviness on semiconductor wafers and other materials. Specifications depend on the installed measurement head and configuration.構成
構成なしOEMモデルの説明
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.ドキュメント
ドキュメントなし
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KLA
P-10
カテゴリ
Profiler
最終検証： 8日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Deinstalled
製品ID：
153632
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
KLA-Tencor P-10 Surface Profiler Manufacturer: KLA-Tencor Model: P-10 Equipment Type: Surface Profiler Measurement Method: Contact Stylus Maximum Wafer Size: 8 inch (200 mm) Measurement Capabilities: Step Height, Surface Roughness, Waviness Vertical Measurement Range: Up to approximately 300 µm (configuration dependent) Vertical Resolution: 0.5 / 2 / 10 Å (depending on configuration) Scan Length: 60 mm standard; up to 150 mm on some configurations Scan Speed: 1 µm/s to 25 mm/s Stylus Tip: Diamond, 2 µm radius (configuration dependent) Stage: Motorized XY Stage The KLA-Tencor P-10 is a contact stylus surface profiler designed for measuring step height, surface roughness, and waviness on semiconductor wafers and other materials. Specifications depend on the installed measurement head and configuration.構成
構成なしOEMモデルの説明
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.ドキュメント
ドキュメントなし