説明
Equipment Type Contact stylus surface profiler Measurement Method Contact stylus profilometry Max. Sample Size 254 mm Max. Scan Length 60 mm Vertical Range 13 µm to 300 µm Vertical Resolution 1 Å at 13 µm range; 25 Å at 300 µm range Scan Speed 1 µm/s to 25 mm/s Stylus Force 1–100 mg Typical Analysis Step height / Roughness / Waviness構成
構成なしOEMモデルの説明
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.ドキュメント
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同様のリスト
すべて表示
KLA
P-10
カテゴリ
Profiler
最終検証： 8日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Deinstalled
製品ID：
153958
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Equipment Type Contact stylus surface profiler Measurement Method Contact stylus profilometry Max. Sample Size 254 mm Max. Scan Length 60 mm Vertical Range 13 µm to 300 µm Vertical Resolution 1 Å at 13 µm range; 25 Å at 300 µm range Scan Speed 1 µm/s to 25 mm/s Stylus Force 1–100 mg Typical Analysis Step height / Roughness / Waviness構成
構成なしOEMモデルの説明
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.ドキュメント
ドキュメントなし