説明
Lot of (Qty 6) Scanning Electron Microscopes (SEM)構成
JEOL JSM 6490LV with EDS Known issues: BSE detector reportedly degraded Tungsten source high / low vacuum 0.3-30 kV Everhart-Thornley SE detector, semiconductor BSE detector and Bruker Quantax 250 EDS 5-axis motorised eucentric stage, X 125 mm / Y 100 mm samples up to 8 inches and 1 kg dual rotary pumps and water-cooled diffusion pump ZEISS LEO 1530 FEG Upgraded by Zeiss to Supra 40 configuration in 2015 Windows 7 / SmartSEM 6.0 new scan generator, HDASB detector, control console and double joystick stage control BSE detector chiller and computer TFS Phenom G4 Desktop scanning electron microscope FEI Quanta 200 FEG MK1 Known issues: FEG tip requires replacement Schottky FEG ESEM vacuum 200 V-30 kV ETD / BSD eucentric stage with X / Y travel -25 to +25 mm, Z 25 mm, 360° rotation and -15° to +75° tilt no clamp micromanipulator and support PC FEI Quanta 450 ESEM Known issues: One BSED segment is reportedly dead; HT supply reportedly failed Tungsten source high vacuum / low vacuum / ESEM Everhart-Thornley SED, large field low-vacuum SED, gaseous SED and IR chamber camera X / Y 100 mm, Z 60 mm stage support PC, manual user interface and joystick FEI Quanta 400 MK2 FEG ESEM with EDS High vacuum / low vacuum / ESEM 200 V-30 kV, probe current up to 100 nA 100 × 100 mm DC stage, Z 60 mm, tilt -5° to +70°, 360° rotation hot and cold stageOEMモデルの説明
提供なしドキュメント
ドキュメントなし
同様のリスト
すべて表示
LOT
EQUIPMENT
カテゴリ
Support Equipment
最終検証： 3日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
155471
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Lot of (Qty 6) Scanning Electron Microscopes (SEM)構成
JEOL JSM 6490LV with EDS Known issues: BSE detector reportedly degraded Tungsten source high / low vacuum 0.3-30 kV Everhart-Thornley SE detector, semiconductor BSE detector and Bruker Quantax 250 EDS 5-axis motorised eucentric stage, X 125 mm / Y 100 mm samples up to 8 inches and 1 kg dual rotary pumps and water-cooled diffusion pump ZEISS LEO 1530 FEG Upgraded by Zeiss to Supra 40 configuration in 2015 Windows 7 / SmartSEM 6.0 new scan generator, HDASB detector, control console and double joystick stage control BSE detector chiller and computer TFS Phenom G4 Desktop scanning electron microscope FEI Quanta 200 FEG MK1 Known issues: FEG tip requires replacement Schottky FEG ESEM vacuum 200 V-30 kV ETD / BSD eucentric stage with X / Y travel -25 to +25 mm, Z 25 mm, 360° rotation and -15° to +75° tilt no clamp micromanipulator and support PC FEI Quanta 450 ESEM Known issues: One BSED segment is reportedly dead; HT supply reportedly failed Tungsten source high vacuum / low vacuum / ESEM Everhart-Thornley SED, large field low-vacuum SED, gaseous SED and IR chamber camera X / Y 100 mm, Z 60 mm stage support PC, manual user interface and joystick FEI Quanta 400 MK2 FEG ESEM with EDS High vacuum / low vacuum / ESEM 200 V-30 kV, probe current up to 100 nA 100 × 100 mm DC stage, Z 60 mm, tilt -5° to +70°, 360° rotation hot and cold stageOEMモデルの説明
提供なしドキュメント
ドキュメントなし