説明
Lot of (Qty 4) Field Emission Scanning Electron Microscopes (SEM) / (Qty 1) Dual Beam FIB-SEM構成
FEI Nova NanoSEM 450 FEG Known issues: FEG source reportedly requires replacement High / low vacuum in-lens TLD-SE / TLD-BSE, Everhart-Thornley SED, low-vacuum SED, IR-CCD, DBS and GAD detectors 5-axis motorised eucentric stage, X / Y 110 × 110 mm, Z 25 mm samples up to 150 mm diameter / 500 g carbon GIS, platinum GIS, plasma cleaner, support PC and manual user interface FEI Nova NanoSEM 200 FEG Known issues: Final lens reportedly not responding Schottky FEG with magnetic immersion final lens high / low vacuum 200 V-30 kV ETD, through-lens, low-vacuum, solid-state BSE and gaseous analytical detectors, IR CCD EDAX PV7761/96 EDS, 10 mm² active area, SUTW window, liquid cooled oil-free turbo / scroll / ion-getter vacuum Fischione cryogenic anti-contamination trap, computer, monitor and specimen tool box FEI Quanta 400 FEG ESEM High vacuum / low vacuum / ESEM 200 V-30 kV, up to 100 nA Everhart-Thornley SED, large field detector, solid-state BSED and GAD 5-axis stage, X / Y 100 mm, Z 60 mm hot and cold stages Sirion FEG column FEI SIRION 200 SFEG Schottky field emission SEM 500 V-30 kV magnification ×30-×600,000 SE / BSE / in-lens detectors images up to 4k × 3k, TIFF 5-axis computer-controlled stage, X / Y 50 × 50 mm electron column replaced in 2022 FEI STRATA DB235 FEG SEM / focused ion beam dual beam for failure analysis, TEM preparation and circuit edit SED / CDEM / TLD 50 × 50 mm stage XeF2 and Pt GISOEMモデルの説明
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最終検証： 3日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
155472
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Lot of (Qty 4) Field Emission Scanning Electron Microscopes (SEM) / (Qty 1) Dual Beam FIB-SEM構成
FEI Nova NanoSEM 450 FEG Known issues: FEG source reportedly requires replacement High / low vacuum in-lens TLD-SE / TLD-BSE, Everhart-Thornley SED, low-vacuum SED, IR-CCD, DBS and GAD detectors 5-axis motorised eucentric stage, X / Y 110 × 110 mm, Z 25 mm samples up to 150 mm diameter / 500 g carbon GIS, platinum GIS, plasma cleaner, support PC and manual user interface FEI Nova NanoSEM 200 FEG Known issues: Final lens reportedly not responding Schottky FEG with magnetic immersion final lens high / low vacuum 200 V-30 kV ETD, through-lens, low-vacuum, solid-state BSE and gaseous analytical detectors, IR CCD EDAX PV7761/96 EDS, 10 mm² active area, SUTW window, liquid cooled oil-free turbo / scroll / ion-getter vacuum Fischione cryogenic anti-contamination trap, computer, monitor and specimen tool box FEI Quanta 400 FEG ESEM High vacuum / low vacuum / ESEM 200 V-30 kV, up to 100 nA Everhart-Thornley SED, large field detector, solid-state BSED and GAD 5-axis stage, X / Y 100 mm, Z 60 mm hot and cold stages Sirion FEG column FEI SIRION 200 SFEG Schottky field emission SEM 500 V-30 kV magnification ×30-×600,000 SE / BSE / in-lens detectors images up to 4k × 3k, TIFF 5-axis computer-controlled stage, X / Y 50 × 50 mm electron column replaced in 2022 FEI STRATA DB235 FEG SEM / focused ion beam dual beam for failure analysis, TEM preparation and circuit edit SED / CDEM / TLD 50 × 50 mm stage XeF2 and Pt GISOEMモデルの説明
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