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ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 9100
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The NanoSpec 9100 is an advanced film analysis system that combines DUV-NIR spectroscopic ellipsometry and DUV-visible spectroscopic reflectometry. It can handle 75mm to 200mm wafers and is equipped with N2000, the first metrology software that meets the SEMI user interface standard E95-0200. The system is designed for optical-telecom and wireless device manufacturing and can handle advanced materials and processes with speed and precision.
    ドキュメント

    ドキュメントなし

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 9100

    verified-listing-icon

    検証済み

    カテゴリ
    Thin Film / Film Thickness

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    12408


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 9100

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 9100

    Thin Film / Film Thickness
    ヴィンテージ: 2002状態: 中古
    最終確認30日以上前

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 9100

    verified-listing-icon
    検証済み
    カテゴリ
    Thin Film / Film Thickness
    最終検証: 60日以上前
    listing-photo-2872a18f1f723da74b82c37fa14053c2a4d5110603860d042e73f1839b31b020-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    12408


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The NanoSpec 9100 is an advanced film analysis system that combines DUV-NIR spectroscopic ellipsometry and DUV-visible spectroscopic reflectometry. It can handle 75mm to 200mm wafers and is equipped with N2000, the first metrology software that meets the SEMI user interface standard E95-0200. The system is designed for optical-telecom and wireless device manufacturing and can handle advanced materials and processes with speed and precision.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 9100

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 9100

    Thin Film / Film Thicknessヴィンテージ: 2002状態: 中古最終検証:30日以上前
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 9100

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 9100

    Thin Film / Film Thicknessヴィンテージ: 2013状態: 中古最終検証:60日以上前
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 9100

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 9100

    Thin Film / Film Thicknessヴィンテージ: 2003状態: 中古最終検証:30日以上前