説明
Ox film thickness measurement( PC missing)構成
構成なしOEMモデルの説明
The NanoSpec 9100 is an advanced film analysis system that combines DUV-NIR spectroscopic ellipsometry and DUV-visible spectroscopic reflectometry. It can handle 75mm to 200mm wafers and is equipped with N2000, the first metrology software that meets the SEMI user interface standard E95-0200. The system is designed for optical-telecom and wireless device manufacturing and can handle advanced materials and processes with speed and precision.ドキュメント
ドキュメントなし
カテゴリ
Thin Film / Film Thickness
最終検証： 13日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
144578
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 9100
カテゴリ
Thin Film / Film Thickness
最終検証： 13日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
144578
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Ox film thickness measurement( PC missing)構成
構成なしOEMモデルの説明
The NanoSpec 9100 is an advanced film analysis system that combines DUV-NIR spectroscopic ellipsometry and DUV-visible spectroscopic reflectometry. It can handle 75mm to 200mm wafers and is equipped with N2000, the first metrology software that meets the SEMI user interface standard E95-0200. The system is designed for optical-telecom and wireless device manufacturing and can handle advanced materials and processes with speed and precision.ドキュメント
ドキュメントなし