説明
Overlaying instrument No missing parts Current Wafer size : 8構成
構成なしOEMモデルの説明
The KLA-Tencor 5200XP is an automated overlay metrology tool for the semiconductor industry. It improves overlay control, maximizes lithography tool utilization, and meets the requirements of 0.18 µm design rules. It has the highest throughput in the industry and is compatible with current factory automation standards.ドキュメント
ドキュメントなし
KLA
5200XP
検証済み
カテゴリ
Overlay
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
Deinstalled
製品ID:
107074
ウェーハサイズ:
6"/150mm, 8"/200mm
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
5200XP
カテゴリ
Overlay
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
Deinstalled
製品ID:
107074
ウェーハサイズ:
6"/150mm, 8"/200mm
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Overlaying instrument No missing parts Current Wafer size : 8構成
構成なしOEMモデルの説明
The KLA-Tencor 5200XP is an automated overlay metrology tool for the semiconductor industry. It improves overlay control, maximizes lithography tool utilization, and meets the requirements of 0.18 µm design rules. It has the highest throughput in the industry and is compatible with current factory automation standards.ドキュメント
ドキュメントなし